Functional Testing of Decoupling Capacitors For Dynamic RAMs Written By: Arch Martin | Ward Parkinson Abstract: Comparative performance of various types of distributed decoupling capacitors both with and without bulk tantalum capacitors is shown under actual operating conditions in a 64K dynamic RAM memory board designed especially for high-frequency in-use testing. Multilayer ceramic capacitors are shown to be effective and economical even without using bulk tantalum capacitors for decoupling.
Decoupling: Basics Written By: Arch Martin Abstract: This paper discusses the characteristics of multilayer ceramic capacitors in decoupling applications and compares their performance with other types of decoupling capacitors. A special high-frequency test circuit is described and the results obtained using various types of capacitors are shown.
AC Termination For Signal Busses Written By: Ben Smith Abstract: The predominant direction of modern electronic system design is towards higher speed and efficiency. This is not to say that efficiency was not an issue in previous designs, but as clock speeds increase, many elements that once were treated as ideal cannot be treated in this manner any longer. Digital system designers are faced with critical issues dealing with maintaining signal integrity while balancing numerous other inhibiting factors. Perhaps one of the more menacing non-ideal effects can be seen in signal transmission through bus lines. Gone are the days when a trace of metal could be treated as a loss less element. Today’s high speed busses require a thorough evaluation
