Functional Testing of Decoupling Capacitors For Dynamic RAMs
Written By: Arch Martin | Ward Parkinson Abstract:
Comparative performance of various types of distributed decoupling capacitors both with and without bulk tantalum capacitors is shown under actual operating conditions in a 64K dynamic RAM memory board designed especially for high-frequency in-use testing. Multilayer ceramic capacitors are shown to be effective and economical even without using bulk tantalum capacitors for decoupling. DOWNLOAD TECHNICAL PAPER
Comparative performance of various types of distributed decoupling capacitors both with and without bulk tantalum capacitors is shown under actual operating conditions in a 64K dynamic RAM memory board designed especially for high-frequency in-use testing. Multilayer ceramic capacitors are shown to be effective and economical even without using bulk tantalum capacitors for decoupling.
